Y. Mashiko et al., A NEW FAILURE ANALYSIS TECHNIQUE USING THE THERMO-ELECTROMOTIVE FORCEINDUCED BY LASER IRRADIATION, Quality and reliability engineering international, 12(4), 1996, pp. 253-257
A new failure analysis technique based on the thermo-electromotive for
ce induced by laser irradiation has been developed for evaluation of i
nterconnects. This technique, which uses a high sensitivity OBIC (opti
cal beam induced current) system, realizes the sensitive detection of
defects, such as infant and advanced defects in aluminium (Al) interco
nnects, with no application of voltage or the removal of overlaid insu
lator films. This technique has been demonstrated in the analyses of m
any modes of interconnect failure.