Jp. Bourgoin et al., HIGH-SPEED LAYER-BY-LAYER PATTERNING OF PHTHALOCYANINE LANGMUIR-BLODGETT-FILMS BY THE ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(5), 1996, pp. 3381-3385
Anisotropic Langmuir-Blodgett films of phthalocyanine derivatives have
been patterned using an atomic force microscope to scan the surface o
f the film at high scan rate (>100 mu m/s). The depth of the periodic
grooved lines, of width down to 50 nm, formed perpendicular to the fas
t scan direction can be controlled to the monolayer level through the
effect of the load (a few nanonewtons) applied to the tip. It is shown
that the patterning results from an oscillation in the feedback loop
resulting in a periodic force modulation of a few nanonewtons along ea
ch scan line. Using the same principle, we show that the microscope ca
n be modified to write patterns of arbitrary form by the superposition
of a given voltage waveform onto the Z piezo voltage. (C) 1996 Americ
an Vacuum Society.