H. Fourre et al., SELECTIVE WET ETCHING OF LATTICE-MATCHED INGAAS INALAS ON INP AND METAMORPHIC INGAAS/INALAS ON GAAS USING SUCCINIC ACID HYDROGEN-PEROXIDE SOLUTION/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(5), 1996, pp. 3400-3402
A selectivity study of the etching of lattice matched (LM) InCaAs/InAl
As on InP and metamorphic (MM) InGaAs/InAlAs on GaAs in succinic acid:
hydrogen peroxide solutions is reported. Selectivities as high as 70
and 1030 are? respectively, obtained for the LM and MM InGaAs on InAlA
s. Observations and measurements with an atomic force microscope of na
rrow recess and under-resist etch on LM InP materials are also present
ed. The ability of these solutions for fabrication of InGaAs/InAlAs he
terojunction field effect transistors is discussed. (C) 1996 American
Vacuum Society.