2 METHODS OF EXPANDING THE MEASUREMENT ABILITIES OF A 4-CIRCLE DIFFRACTOMETER

The measuring routines of a conventional four-circle diffractometer (S toe) have been modified to allow various scan types in a fully automat ic mode. Scan parameters may be entered either as angular (2 theta, om ega, chi, phi) or as hkl values and are given by two ASCII input files . A set of scans in up to four dimensions may be performed. Scans perf ormed with hkl values are based on the orientation matrix of the singl e crystal or the matrix of the substrate for the investigations of par tially crystallized thin films. The relative orientations of thin film s and substrates can be determined.