VALIDATION OF MODELS FOR SUBGRAIN GROWTH IN HG1-XCDXTE (MCT) BY THERMAL ANNEALING

Authors
PEREZ LV TRIGUBO AB DERECA NEW
Citation
Lv. Perez et al., VALIDATION OF MODELS FOR SUBGRAIN GROWTH IN HG1-XCDXTE (MCT) BY THERMAL ANNEALING, Journal of crystal growth, 167(1-2), 1996, pp. 87-92
Citations number
28
Categorie Soggetti
Crystallography
Journal title
Journal of crystal growth → ACNP
ISSN journal
00220248
Volume
167
Issue
1-2
Year of publication
1996
Pages
87 - 92
Database
ISI
SICI code
0022-0248(1996)167:1-2<87:VOMFSG>2.0.ZU;2-V
Abstract
The effect of thermal annealing on the increase of subgrain size is st udied in Bridgman grown Hg1-xCdxTe (x = 0.2). The subgrain size is mea sured by X-ray topography and the log-normal distribution is the best fit to the subgrain size experimental results. Different growth models to explain the increase of subgrains are discussed.