A NEW STATISTICAL-MODEL FOR FITTING BIMODAL OXIDE BREAKDOWN DISTRIBUTIONS AT DIFFERENT FIELD CONDITIONS

Authors
DEGRAEVE R ROUSSEL P OGIER JL GROESENEKEN G MAES HE
Citation
R. Degraeve et al., A NEW STATISTICAL-MODEL FOR FITTING BIMODAL OXIDE BREAKDOWN DISTRIBUTIONS AT DIFFERENT FIELD CONDITIONS, Microelectronics and reliability, 36(11-12), 1996, pp. 1651-1654
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
36
Issue
11-12
Year of publication
1996
Pages
1651 - 1654
Database
ISI
SICI code
0026-2714(1996)36:11-12<1651:ANSFFB>2.0.ZU;2-C
Abstract
A new statistical model for fitting competing Weibull distributions is introduced. This model takes into account that capacitors with proces s-induced defects can also fail intrinsically if they survive the extr insic breakdown mode. It is shown that this model in combination with a field acceleration law for intrinsic and extrinsic breakdown, can be implemented in a maximum likelihood fitting algorithm, allowing to fi t a complete set of breakdown data obtained at different field conditi ons simultaneously in one single calculation. Copyright (C) 1996 Elsev ier Science Ltd