W. Lawton et J. Barrett, CHARACTERIZATION OF CHIP-ON-BOARD AND FLIP-CHIP PACKAGING TECHNOLOGIES BY ACOUSTIC MICROSCOPY, Microelectronics and reliability, 36(11-12), 1996, pp. 1803-1806
In recent years scanning acoustic microscopy (SAM) has been found to b
e a very successful technique when used in the microelectronics indust
ry to evaluate,from a reliability perspective, standard plastic packag
ing technologies such as PQFP's, PLCC's, DIP's and SOP's. Very little
research has been reported in the application of SAM as a technique fo
r determining the quality and reliability of packaging technologies su
ch as Chipon-Board (COB) and Flip Chip adhered devices, however. These
areas will be addressed in this paper. Copyright (C) 1996 Elsevier Sc
ience Ltd