CHARACTERIZATION OF CHIP-ON-BOARD AND FLIP-CHIP PACKAGING TECHNOLOGIES BY ACOUSTIC MICROSCOPY

Citation
W. Lawton et J. Barrett, CHARACTERIZATION OF CHIP-ON-BOARD AND FLIP-CHIP PACKAGING TECHNOLOGIES BY ACOUSTIC MICROSCOPY, Microelectronics and reliability, 36(11-12), 1996, pp. 1803-1806
Citations number
2
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00262714
Volume
36
Issue
11-12
Year of publication
1996
Pages
1803 - 1806
Database
ISI
SICI code
0026-2714(1996)36:11-12<1803:COCAFP>2.0.ZU;2-7
Abstract
In recent years scanning acoustic microscopy (SAM) has been found to b e a very successful technique when used in the microelectronics indust ry to evaluate,from a reliability perspective, standard plastic packag ing technologies such as PQFP's, PLCC's, DIP's and SOP's. Very little research has been reported in the application of SAM as a technique fo r determining the quality and reliability of packaging technologies su ch as Chipon-Board (COB) and Flip Chip adhered devices, however. These areas will be addressed in this paper. Copyright (C) 1996 Elsevier Sc ience Ltd