Cu-In-Se films have been deposited by a hot-wall evaporation technique
using CuCl and In2Se3 as source materials. The composition of films w
as severely dependent on the substrate temperature. In the present stu
dy, near-stoichiometric CuInSe2 films were deposited on the substrate
heated to about 440 degrees C when CuCl and In2Se3 were respectively s
ublimed from two sources heated to 260 and 560 degrees C. X-ray diffra
ction measurement detected no additional second phase and the film exh
ibited low resistivity and p-type conduction.