IN-PROCESS BOARD WARPAGE MEASUREMENT IN A LAB SCALE WAVE SOLDERING OVEN

Citation
Mr. Stiteler et al., IN-PROCESS BOARD WARPAGE MEASUREMENT IN A LAB SCALE WAVE SOLDERING OVEN, IEEE transactions on components, packaging, and manufacturing technology. Part A, 19(4), 1996, pp. 562-569
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Manufacturing","Material Science
ISSN journal
10709886
Volume
19
Issue
4
Year of publication
1996
Pages
562 - 569
Database
ISI
SICI code
1070-9886(1996)19:4<562:IBWMIA>2.0.ZU;2-W
Abstract
An automated on-line warpage measurement system for printed wiring boa rds (PWB's) and printed wiring board assemblies (PWBA's) has been deve loped. The system is capable of simulating a variety of soldering proc esses, including the wave soldering process, and performing real-time PWB/PWBA warpage measurements using the shadow moire technique. The sy stem can be used to characterize the warpage behavior of virtually any PWB/PWBA during the soldering process. Using this system, warpage of PWB test vehicles was measured during simulated wave soldering. The me asured warpage varied significantly during wave soldering from that ob served both before and after wave soldering. These results help us to understand how the board deforms at every stage of the soldering proce ss.