TRENDS OF TESTING TECHNOLOGY FOR ELECTRON IC COMPONENTS

Authors
HAPPE A
Citation
A. Happe, TRENDS OF TESTING TECHNOLOGY FOR ELECTRON IC COMPONENTS, TM. Technisches Messen, 63(10), 1996, pp. 351-351
Citations number
NO
Categorie Soggetti
Instument & Instrumentation
Journal title
TM. Technisches Messen → ACNP
ISSN journal
01718096
Volume
63
Issue
10
Year of publication
1996
Pages
351 - 351
Database
ISI
SICI code
0171-8096(1996)63:10<351:TOTTFE>2.0.ZU;2-L