Gp. Hastie et al., APPLICATION OF POLARIZED ULTRA-SOFT X-RAY-ABSORPTION NEAR-EDGE SPECTROSCOPY TO THE CHARACTERIZATION OF THE STRUCTURE OF MOLECULAR INTERFACES, Journal of crystal growth, 166(1-4), 1996, pp. 67-71
The use and suitability of synchrotron, polarised ultra-soft X-ray abs
orption near-edge structure (XANES) spectroscopy, for surface characte
risation in realistic thermodynamic conditions is described and illust
rated through an examination of the melting characteristics of the sur
face and subsurface regions of a normal alkane thin film deposited on
Si(111).