APPLICATION OF POLARIZED ULTRA-SOFT X-RAY-ABSORPTION NEAR-EDGE SPECTROSCOPY TO THE CHARACTERIZATION OF THE STRUCTURE OF MOLECULAR INTERFACES

Authors
HASTIE GP JOHNSTONE J ROBERTS KJ FISCHER D
Citation
Gp. Hastie et al., APPLICATION OF POLARIZED ULTRA-SOFT X-RAY-ABSORPTION NEAR-EDGE SPECTROSCOPY TO THE CHARACTERIZATION OF THE STRUCTURE OF MOLECULAR INTERFACES, Journal of crystal growth, 166(1-4), 1996, pp. 67-71
Citations number
24
Categorie Soggetti
Crystallography
Journal title
Journal of crystal growth → ACNP
ISSN journal
00220248
Volume
166
Issue
1-4
Year of publication
1996
Pages
67 - 71
Database
ISI
SICI code
0022-0248(1996)166:1-4<67:AOPUXN>2.0.ZU;2-I
Abstract
The use and suitability of synchrotron, polarised ultra-soft X-ray abs orption near-edge structure (XANES) spectroscopy, for surface characte risation in realistic thermodynamic conditions is described and illust rated through an examination of the melting characteristics of the sur face and subsurface regions of a normal alkane thin film deposited on Si(111).