Two centrifugal techniques, I and II, have been applied to grow semico
nductor layers in a rotating crucible. Technique I employs centrifugal
forces to transport the solutions in the liquid phase epitaxial proce
ss. Layers of Si and SiGe grown on 100 mm diameter Si wafers and of Ga
As on GaAs substrates outlined the capability and potentialities of te
chnique I. Technique II requires higher rotational frequencies of the
crucible. The higher centrifugal forces available in this technique in
fluence the local distribution of the solute in the solvent. Locally i
ncreased solute concentration in the solution allows us to prepare mul
ticrystalline self-supporting and inclusion-free films. or to prepare
thick homo- and hetero-epitaxial LPE layers even on dissimilar substra
tes. We describe, in this paper, experimental results obtained by grow
ing SiGe layers on 100 mm single-crystalline Si wafers using centrifug
al technique I. We describe also the first results obtained by centrif
ugal technique II, and thereby focus on self-supporting multicrystalli
ne sheets of Si, SiGe, and GaAs, and on multicrystalline Ge layers gro
wn on sintered porous quartz substrates.