Silicon single crystals with uniformity along the growth direction wer
e grown using a new continuous Czochralski (CCZ) method. Polycrystalli
ne silicon rods used as charge materials are melted by carbon heaters
over a crucible without contact between the raw material and other sub
stances. Using this method, silicon crystals with diameters as large a
s 6 or 8 inch and good uniformity along the growth direction were grow
n.