F. Rosenberger et al., NUCLEATION AND CRYSTALLIZATION OF GLOBULAR-PROTEINS - WHAT WE KNOW AND WHAT IS MISSING, Journal of crystal growth, 168(1-4), 1996, pp. 1-27
Recently, much progress has been made in understanding the nucleation
and crystallization of globular proteins, including the formation of c
ompositional and structural crystal defects. Insight into the interact
ions of (screened) protein macro-ions in solution, obtained from light
scattering, small angle X-ray scattering and osmotic pressure studies
, can guide the search for crystallization conditions. These studies s
how that the nucleation of globular proteins is governed by the same p
rinciples as that of small molecules. However, failure to account for
direct and indirect (hydrodynamic) protein interactions in the solutio
ns results in unrealistic aggregation scenarios. Microscopic studies o
f numerous proteins reveal that crystals grow by the attachment of gro
wth units through the same layer-spreading mechanisms as inorganic cry
stals. Investigations of the growth kinetics of hen-egg-white lysozyme
(HEWL) reveal non-steady behavior under steady external conditions. L
ong-term variations in growth rates are due to changes in step-origina
ting dislocation groups. Fluctuations on a shorter timescale reflect t
he non-linear dynamics of layer growth that results from the interplay
between interfacial kinetics and bulk transport. Systematic gel elect
rophoretic analyses suggest that most HEWL crystallization studies hav
e been performed with material containing other proteins at percent le
vels. Yet, sub-percent levels of protein impurities impede growth step
propagation and play a role in the formation of structural/compositio
nal inhomogeneities. In crystal growth from highly purified HEWL solut
ions, however, such inhomogeneities are much weaker and form only in r
esponse to unusually large changes in growth conditions. Equally impor
tant for connecting growth conditions to crystal perfection and diffra
ction resolution are recent advances in structural characterization th
rough high-resolution Bragg reflection profiling and X-ray topography.