R. Grimm et al., DETERMINATION OF THE INELASTIC MEAN FREE-PATH IN ICE BY EXAMINATION OF TILTED VESICLES AND AUTOMATED MOST PROBABLE LOSS IMAGING, Ultramicroscopy, 63(3-4), 1996, pp. 169-179
Using electron microscopy, the thickness of ice-embedded vesicles is e
stimated examining tilted and untilted views and assuming an ellipsoid
al shape of the vesicles that appear to be circular in the untilted vi
ew. Another thickness measure is obtained from the ratio of the unfilt
ered and zero-loss-filtered image intensities of the vesicle. From the
se two measure ments, the mean free path Lambda for inelastic scatteri
ng of electrons in ice is calculated as 203 +/- 33 nm for 120 kV accel
eration voltage. It is found that vesicles in thin ice films (less tha
n or equal to 1.5 Lambda) significantly protrude out of the ice film.
Due to surface tension the shape becomes an oblate ellipsoid. In holes
covered with a thick ice film (greater than or equal to 3 Lambda) and
strong thickness gradients, vesicles are predominantly found in regio
ns where the ice thickness is appropriate for their size. Also, a way
of imaging the most probable loss under low-dose conditions involving
thickness measurement is proposed. Even at large ice thicknesses zero-
loss filtering always gives better image contrast. Most probable loss
imaging can only help where there is no intensity in the zero-loss ima
ge, at very large thicknesses (Lambda>8).