SYNCHROTRON-RADIATION-INDUCED X-RAY MICROFLUORESCENCE ANALYSIS

Citation
K. Janssens et al., SYNCHROTRON-RADIATION-INDUCED X-RAY MICROFLUORESCENCE ANALYSIS, Mikrochimica acta, 1996, pp. 87-115
Citations number
53
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00263672
Year of publication
1996
Supplement
13
Pages
87 - 115
Database
ISI
SICI code
0026-3672(1996):<87:SXMA>2.0.ZU;2-#
Abstract
mu-XRF is the microscopic equivalent of the well-established multielem ent analytical technique. In this paper, after comparing the interacti on of X-ray photons, electrons and protons with matter and an introduc tion to synchrotron rings and microfocussing of X-rays, the instrument ation for mu-XRF is discussed, both for laboratory source and synchrot ron based setups and the analytical characteristics of mu-XRF are cont rasted to that of other microanalytical techniques, Also, this issue o f quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.