Secondary ion mass spectrometry in the ''static mode'' is becoming a k
ey technique for the surface characterization of organic materials. Th
is is due to the very specific chemical information derived from chara
cteristic molecular secondary ions. The present expansion of this tech
nique is related to the development of high performance time-of-flight
mass spectrometers. Indeed they combine high mass resolution allowing
to resolve mass interferences between isobaric molecular secondary io
ns, unlimited mass range, high transmission allowing to reduce the tot
al ion fluence per spectrum (<10(12) ions/cm(2)) and the molecular ima
ging capabilities in microscope and/or microprobe modes. The aim of th
is paper is to present a general view on the basic principles and expe
rimental developments of ToF-SIMS. The present understanding of the se
condary molecular ion formation mechanisms in organic materials (polym
ers) will be reviewed and illustrated. Different applications coming m
ainly from our recent work will be treated with special emphasis on im
aging. They concern surface composition and morphology of polymer blen
ds, contamination and additives at polymer surfaces, plasma treated po
lymer surfaces and carbon fibers in polymer matrix.