Based on the multiple-reflection model first suggested by V. Lantto a
new description of electrons penetrating with an oblique angle of inci
dence into the sample is reported, In contrast to most of the authors,
who are trying to adapt models for normal incidence to the experiment
al results for tilted samples, our model describes the altered shape o
f the depth distribution function as a consequence of changed physical
quantities due to different geometry. These quantities used for the m
ulti-reflection model are: angular- and energy-distributions of backsc
attered and transmitted electrons, the backscattering- and the transmi
ssion-coefficient. The theoretically derived depth distribution functi
ons are compared with results from Monte Carlo simulations.