Investigations and new developments of a simple multiple electron scat
tering model by August are the basis for further calculations of chara
cteristic and continuous depth distribution functions. The validity of
the predicted depth distributions has been demonstrated by comparison
s with other models. Therefore, application of the simple electron sca
ttering model in correction programs for the determination of elementa
l concentrations and film thicknesses is justified. Within the scope o
f these correction calculations, accurate knowledge of the excited bre
amsstrahlung spectrum is essential for quantitative analysis, especial
ly in the field of EDS and peak-to-background measurements. Using the
description of the continuous depth distribution, a calculation method
for breamsstrahlung spectra applicable to any bulk or multilayer samp
le is presented.