MEASUREMENT OF THE MODULATION TRANSFER-FUNCTION OF A SLOW-SCAN CCD CAMERA ON A TEM USING A THIN AMORPHOUS FILM AS TEST SIGNAL

A technique is proposed to measure the modulation transfer function of a slow-scan CCD camera mounted on a transmission electron microscope. The measurement is done from only three images: two images taken at d ifferent magnifications of a thin amorphous specimen and one image tak en without a specimen in the electron beam. The advantage of this tech nique is that neither the CCD camera has to be dismounted nor special equipment has to be used. The first experiments show that this techniq ue gives reproducible results, but more experiments are necessary to c ompare the results with other methods.