More for technical rather than for physical reasons, off-axis electron
holograms are usually taken with the biprism positioned in the select
ed area aperture holder. Since the quality of the holograms has to be
optimized in every respect for high performance electron holography, t
he influence of the biprism position in the electron microscope on the
hologram quality is studied in more detail. The results show that the
re is an optimum geometric arrangement of the biprism in the column of
the electron microscope characterized by a minimum biprism deflection
angle required for a hologram with given width and fringe spacing.