Phase-retrieval methods in high-resolution transmission electron micro
scopy allow one to determine the wave function at the exit-plane of th
e object (the exit-plane wave function). Viable methods for the retrie
val of the exit-plane wave function are off-axis electron holography a
nd focal-series reconstruction. In the framework of these methods, att
ention has been directed so far mostly at the correction of the wave f
unction with respect to the ''main'' contributions to the aberration f
unction, which are caused by the spherical aberration and by the defoc
using of the objective lens. We describe a procedure which allows to m
easure and correct routinely for all relevant residual aberrations whi
ch may be present due to possible beam misalignment, 2-fold or 3-fold
astigmatism. Using focal-series reconstruction it is demonstrated that
a substantial gain in interpretable resolution can be observed in the
retrieved wave function by taking into account these additional aberr
ation effects.