The operation of an electret microphone as a sensitive force sensor in
scanning probe microscopy is described. The behavior of the electret
microphone used as a capacitive force sensor is characterized and the
experimental setup for a combined STM/SFM is described. First applicat
ions of this hybrid microscope to biological objects are presented. Un
like in conventional force microscopy, the sample can be placed on the
top of the force sensor. This allows for a free choice of the near-fi
eld probe. Hence, the electret microphone is well suited for combined
scanning microscopies where the probe-re-sample distance is kept const
ant by force gradient measurement while the near-field probe measures
some local properties of the specimen.