P. Groning et al., SELF-THICKNESS-LIMITED PLASMA POLYMERIZATION OF AN ULTRATHIN ANTIADHESIVE FILM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(6), 1996, pp. 3043-3048
Citations number
22
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Ultrathin (<5 nm) fluorinated polymer films of homogeneous thicknesses
have been deposited from a CF4/H-2 microwave discharge. The films hav
e an extremely low surface energy of 4.2 mJ/m(2), which is more than f
our times lower than that for polytetrafluoroethylene. The deposition
was carried out in a type of ''self-thickness-limited'' mode, in which
the thickness of the deposited polymer film is limited by the plasma
parameters. The deposition can be separated into two phases, a growth
and a treatment phase. During the treatment phase, the deposited film
is fluorinated, which results in a dramatic decrease of the surface en
ergy. The thickness limiting behavior of the plasma is explained by th
e dualism of etching and polymerization occurring in fluorocarbon disc
harges. The film was tested as antiadhesion film for the replication o
f micro-optical structures, using a Ni shim with a very fine surface r
elief grating (400 nm periodicity) to hot emboss (at 180 degrees C) po
lycarbonate sheed. The tests demonstrate the excellent antiadhesive pr
operty of the film with the polycarbonate and reveal a good adhesion o
f the film with the Ni substrate. (C) 1996 American Vacuum Society.