A detailed investigation of quality enhancement techniques, such as PE
CVD SiO2/SiN deposition and forming gas anneal (FGA) for defect passiv
ation, and Al treatment for defect and impurity gettering, was conduct
ed on several promising multicrystalline Si materials. The PECVD SiO2/
SiN coating increased the bulk lifetime by a factor of 1.3 to 1.7, and
decreased the surface recombination by a factor of 5-22, depending up
on the multicrystalline material. Besides bulk and surface defect pass
ivation, PECVD coatings were also found to be very effective in passiv
ating phosphorus diffused emitters. Al gettering in multicrystalline S
i showed a significant improvement in bulk lifetime and Light Beam Ind
uced Current (LBIC) response. FGA in conjunction with Al treatment res
ulted in an additional improvement in bulk lifetime in certain materia
ls. Solar cells fabricated on EFG sheet Si showed an efficiency improv
ement of 2.6% from FGA alone, 1.5% due to Al gettering alone, and 1.2%
from Al diffusion and FGA interaction. Finally, cells fabricated on c
ast Si from Sitix corporation, using optimized gettering and passivati
on techniques, gave record high multicrystalline Si efficiency of 17.8
%.