Re. Pratt et al., EFFECT OF SOLID-STATE INTERMETALLIC GROWTH ON THE FRACTURE-TOUGHNESS OF CU 63SN-37PB SOLDER JOINTS/, IEEE transactions on components, packaging, and manufacturing technology. Part A, 19(1), 1996, pp. 134-141
The mode I chevron notch fracture toughness of Cu/63Sn-37Pb solder joi
nts was measured as a function of solid-state copper-tin intermetallic
growth at the solder/copper interface. Soldered chevron notched bend
samples were aged in a furnace at 170 degrees C to promote the interme
tallic growth and the samples were tested at room temperature after 1,
3, 10, 30, and 75 days of growth. The total thickness of the interfac
ial intermetallic layer and the individual thicknesses of the componen
t Cu6Sn5 and Cu3Sn layers were monitored at each stage. The chevron no
tch fracture toughness is correlated with the intermetallic layer thic
kness measurements and the fracture surface morphology. The results sh
ow that at a total intermetallic layer thickness below 5 mu m, failure
is dominated by microvoid coalescence in the solder, and intermetalli
c growth has little effect on the fracture toughness. At a total thick
ness exceeding 7 mu m, however, fracture occurs by cleavage of the int
erfacial intermetallic particles and the fracture toughness decreases
steadily as the intermetallic layer thickness increases. With a total
intermetallic layer thickness of 19 mu m, the chevron notch fracture t
oughness is only 30% of that measured for an as-soldered, nonaged sold
er joint.