PREMISE-FREE RECONSTRUCTION OF THE EXIT-SURFACE WAVE-FUNCTION IN HRTEM

A method is presented which allows us to quantify the information cont ained in high-resolution electron micrographs by the measurement of th e intensity of reflections in diffractograms. Due to transfer gaps of the contrast transfer function and in order to extend the experimental information, focus series are applied. As final results the imaging p arameters are determined simultaneously with the amplitudes and phases of the Fourier components of the exit-surface wave function. The proc edure is tested using images simulated close to realistic conditions a nd proven to work. First results from an application to experimental f ocus series are presented.