IN-SITU ION-IRRADIATION AND ELECTRON-IRRADIATION EFFECTS STUDIES IN TRANSMISSION ELECTRON-MICROSCOPES

Interfacing an ion accelerator to a transmission electron microscope ( TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. The techniques an d special procedures for performing quantitative TEM studies employing in situ ion and electron irradiation are summarized in the context of several irradiation-induced amorphization and irradiation-assisted cr ystallization studies, which illustrate the dynamics of this approach in the materials science of irradiation effects.