A new avalanche photodiode device is proposed that has superior noise
and bandwidth performance, This structure in; corporates a drift regio
n on both sides of the high field avalanche region. With the proper de
sign, this reduces the capacitance by nearly a factor of two, without
degrading the transit-time limited speed,In fact, it is shown that the
double-drift structure can actually improve the intrinsic device spee
d, It is also shown that for high speed devices in which the layers mu
st be kept thin, it can be advantageous to absorb light on both sides
of the avalanche region, in spite of the consequent increase in the ex
cess noise factor.