ASAXS FROM CDSXSE1-X-DOPED SILICATE-GLASSES

Anomalous small-angle X-ray scattering (ASAXS) was employed to analyze CdSxSe1-x-doped silicate glasses, x = 0.4 and 0.6. From the intensity variations, as measured for four X-ray energies near the K-absorption edge of Se and at 9.5 keV, reliable values for the ratio of molecular densities in the crystalline CdSxSe1-x phase and the surrounding amor phous matrix were found. Combination of this with the integrated inten sity yields values for the CdSxSe1-x volume fraction of 0.7 to 3%. Mea n particle radii between 5 and 7 nm and number densities in the range 1 to 8 x 10(16) cm(-3) were obtained from fitted Gaussian and log-norm al size distributions, respectively.