2-DIMENSIONAL FOCUSING X-RAY OPTICS - APPLICATION OF ANISOTROPIC ELASTICITY THEORY FOR CHARACTERIZATION OF BENT CRYSTALS

Citation
Fn. Chukhovskii et al., 2-DIMENSIONAL FOCUSING X-RAY OPTICS - APPLICATION OF ANISOTROPIC ELASTICITY THEORY FOR CHARACTERIZATION OF BENT CRYSTALS, Journal of applied crystallography, 27, 1994, pp. 971-979
Citations number
24
Categorie Soggetti
Crystallography
ISSN journal
00218898
Volume
27
Year of publication
1994
Part
6
Pages
971 - 979
Database
ISI
SICI code
0021-8898(1994)27:<971:2FXO-A>2.0.ZU;2-B
Abstract
Anisotropic elasticity theory is applied to calculations of the one- a nd two-dimensional curved crystals widely employed in X-ray optics. Th e expression for the displacement vector involved in the process of X- ray Bragg diffraction by a curved crystal is derived. The derivation t akes into account the anisotropic elasticity effects for a crystal pla te subjected to pure bending. Expressions for the angular deviation fr om the Bragg angle along the crystal surface are obtained for cylindri cally, spherically and toroidally bent crystal geometries. The relatio nship between the radii of curvature of the crystal and the crystal's compliance tenser is discussed. It is shown that, for a given crystal, the occurrence of the anticlastic curvature effect directly depends o n the crystal orientation. Bent silicon crystal plates with (200), (11 1) and (220) orientations are used to illustrate the influence of the anisotropic elasticity effects on the shape of the diffracting region on the crystal's surface.