LIQUID-PHASE EPITAXIAL-GROWTH AND CHARACTERIZATION OF LINBO3 SINGLE-CRYSTAL FILMS

LiNbO3 (LN) thin film crystals are prepared on LN substrates by a liqu id phase epitaxial method. An X-ray double crystal diffraction techniq ue is used to characterize misfit strain in LN films. Analysis of latt ice parameter differences along the c-axis shows that LN films of almo st stoichiometric composition can be grown on an LN substrate prepared by the Czochralski method, X-ray topography reveals that the LN films have a lower dislocation density than the substrate crystals. Surface morphology is changed with increasing film thickness; thicker films d o not show a mirror surface, rather hillocks with a three-fold symmetr y appear.