PROTEIN ELECTROPHORETIC PATTERN AND BREADMAKING PERFORMANCE OF WHEAT BREAD DOUGHS AND BREAD STARTED WITH PURE AND ASSOCIATED CULTURES OF YEAST AND LACTIC-ACID BACTERIA

Citation
Af. Mascaros et C. Collar, PROTEIN ELECTROPHORETIC PATTERN AND BREADMAKING PERFORMANCE OF WHEAT BREAD DOUGHS AND BREAD STARTED WITH PURE AND ASSOCIATED CULTURES OF YEAST AND LACTIC-ACID BACTERIA, Revista espanola de ciencia y tecnologia de alimentos, 34(5), 1994, pp. 507-526
Citations number
NO
Categorie Soggetti
Food Science & Tenology",Agriculture,"Chemistry Applied
ISSN journal
1131799X
Volume
34
Issue
5
Year of publication
1994
Pages
507 - 526
Database
ISI
SICI code
1131-799X(1994)34:5<507:PEPABP>2.0.ZU;2-B
Abstract
Biochemical changes during fermentation and thermal degradation during baking in salt-soluble (SSP) and dioxane-soluble (DSP) polypeptide an d protein subunits were correlated with functional dough properties an d bread characteristics of straight wheat flour samples started with p ure yeast (Saccharomyces cerevisiae) and associated populations of yea st and lactic acid bacteria (Lactobacillus brevis, L. plantarum, Enter ococcus faecium). Within functional properties, dough extensibility hi ghly correlated (R(2) = 0.896) with changes during fermentation of a w ide range of different size subunits in SSP and DSP extracts (17000, 2 4000, 35000, 58000, 67000 D), maximum resistance to the extension clos ely related (R(2) = 0.932) With dynamics in low molecular weight subun its (6000, 8000, 20000, 35000 and 40000 D), and dough level showed hig h dependence (R(2) = 0.930) On changes in 6000, 20000, 21000 and 65000 D subunits. Bread texture (R(2) = 0.927) was negatively affected by t hermal degradation during baking undergone by 20000 and 21000 D subuni ts (SSP); whereas, changes in 6000 and 58000 D (SSP) correlated with c rumb softness. Improving effects in crumb eatability were dependent (R (2) = 0.906) on changes during baking of small size (21000, 25000 D) a nd high size (90000, 95000 D) DSP-subunits. Overall acceptance of brea ds (R(2) = 0.958) positively related with the depletion during baking in 17000, 20000, 37000 and 43500 D (SSP, DSP) subunits, and negatively correlated with degradation of 37000 (SSP) and 65000 D (DSP) subunits .