Mb. Kong et Ks. Park, OPTIMAL REPLACEMENT OF AN ITEM SUBJECT TO CUMULATIVE DAMAGE UNDER PERIODIC INSPECTIONS, Microelectronics and reliability, 37(3), 1997, pp. 467-472
An item undergoes cumulative damage through use. The item fails random
ly but the failure rate depends on the accumulated damage. The item is
preventively replaced if it survives a certain damage limit at period
ic inspections; on failure, it is replaced immediately. The optimal da
mage limit for preventive replacement which minimizes the long-run exp
ected cost rate is derived. It is unique if an item has increasing dam
age-dependent failure rate. Numerical example for a stationary gamma p
rocess with Weibull distributed failure is given. Copyright (C) 1996 E
lsevier Science Ltd.