A DESIGN OF EXPERIMENT ANALYSTS OF SERIAL EEPROM ENDURANCE

The results of a study using a design of experiments approach to exami ne the effects of environmental operating conditions on serial EEPROM endurance are presented. The conditions studied in the experiment were operating temperature, applied voltage, device type, array usage, wri te cycles per day, data pattern, and write pulse width. An ANOVA table showing the significant effects and an estimation of the value of the effects using an error minimization technique is presented. While the techniques presented are relatively simple, they may be useful as a q uick check of acceleration effects in EEPROM endurance cycling, withou t the use of extensive factorial experiments. The results show tempera ture, array size and voltage to be the most important effects on EEPRO M endurance cycling. The temperature effect matches other published da ta. Copyright (C) 1996 Elsevier Science Ltd.