COMPARISONS OF BLOCK DIAGRAM AND MARKOV METHOD SYSTEM RELIABILITY ANDMEAN TIME TO FAILURE RESULTS FOR CONSTANT AND NONCONSTANT UNIT FAILURE RATES

Authors
DHILLON BS YANG N
Citation
Bs. Dhillon et N. Yang, COMPARISONS OF BLOCK DIAGRAM AND MARKOV METHOD SYSTEM RELIABILITY ANDMEAN TIME TO FAILURE RESULTS FOR CONSTANT AND NONCONSTANT UNIT FAILURE RATES, Microelectronics and reliability, 37(3), 1997, pp. 505-509
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
37
Issue
3
Year of publication
1997
Pages
505 - 509
Database
ISI
SICI code
0026-2714(1997)37:3<505:COBDAM>2.0.ZU;2-O
Abstract
This paper presents a comparison of system reliability and mean time t o failure results obtained using two different methods (i.e. block dia gram and Markov) for the same system with constant and non-constant un it failures rates. The device of stages approach is used to obtain the non-constant unit failure rate when using the Markov method. Copyrigh t (C) 1996 Elsevier Science Ltd.