NONDESTRUCTIVE TECHNIQUE FOR ESTIMATING GATE LENGTHS OF MESFETS AND HEMTS USING LOW-FIELD DC-IV DATA

Authors
KACHWALLA Z
Citation
Z. Kachwalla, NONDESTRUCTIVE TECHNIQUE FOR ESTIMATING GATE LENGTHS OF MESFETS AND HEMTS USING LOW-FIELD DC-IV DATA, Solid-state electronics, 38(1), 1995, pp. 243-245
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
Solid-state electronics → ACNP
ISSN journal
00381101
Volume
38
Issue
1
Year of publication
1995
Pages
243 - 245
Database
ISI
SICI code
0038-1101(1995)38:1<243:NTFEGL>2.0.ZU;2-X