ANALYSIS OF THE INPLANE BANDGAP DISTRIBUTION IN SELECTIVELY GROWN INGAAS INGAASP MULTIPLE-QUANTUM-WELL BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION/
T. Itagaki et al., ANALYSIS OF THE INPLANE BANDGAP DISTRIBUTION IN SELECTIVELY GROWN INGAAS INGAASP MULTIPLE-QUANTUM-WELL BY LOW-PRESSURE METALORGANIC CHEMICAL-VAPOR-DEPOSITION/, Journal of crystal growth, 145(1-4), 1994, pp. 256-262
The in-plane distribution of growth rate enhancement and bandgap (E(g)
) of the selectively grown InGaAs/In GaAsP multiple quantum well (MQW)
structure using a twin stripe mask is investigated. The dependence of
the growth rate enhancement and E(g) transition profile on the mask w
idth and mask opening width is investigated experimentally, and discus
sed by the simulation based on the vapor phase diffusion model of the
re-evaporated reactant from the mask to the open area. Growth profile
in the direction perpendicular to the stripe is explained by one-dimen
sional vapor phase diffusion. Bandgap transition length along the mask
opening stripe decreases with decreasing the mask width and the mask
opening width. In-plane bandgap distribution is calculated by simple t
wo-dimensional diffusion model, and the results are consistent with th
e experimental data.