R. Hovel et al., THE GROWTH OF GAAS ALXGA1-XAS WITH DEALH-NME(3) AS AL SOURCE AND MEASAND DMAAS AS LIQUID AS COMPOUNDS/, Journal of crystal growth, 145(1-4), 1994, pp. 498-504
We report on the growth of GaAs and AlGaAs with either MEAs (monoethyl
arsine) or DMAAs (trisdimethylaminoarsenic) as alternative group V com
pounds in combination with the Al source DEAlH-NMe(3) (diethyl-alumini
umhydride-trimethylamine adduct) and TEGa (triethylgallium). GaAs/AlGa
As layers grown with DEAlH-NMe(3), TEGa and AsH3 show very good electr
ical and optical properties. For example, the oxygen and carbon conten
t in an Al0.29Ga0.71As layer is lower than the detection limit of the
SIMS measurement (O: similar to 10(16) cm(-3); C: content similar to 1
0(15) cm(-3)). First multiple single quantum wells were grown with the
Al source in combination with TEGa and AsH3. To enhance the safety of
the growth process, experiments with the alternative As precursors DM
AAs and MEAs were carried out. Growth studies of GaAs and AlGaAs with
DMAAs as As source and TEGa and DEAlH-NMe(3) as group III precursors i
ndicated undesired prereactions and make DMAAs unsuitable for the grow
th of Al containing layers. Using MEAs instead of AsH3, no indication
of prereactions was found. Encouraging electrical and optical properti
es were achieved for the growth of GaAs (mu(77) = 39.100 cm(2)/V.s, n(
77) = 7.1 X 10(14) cm(-3)) and AlGaAs (12 K PL FWHM = 11 meV for x(Al)
= 0.30). Our results prove that the precursor combination MEAs, TEGa
and DEAlH-NMe(3) is suitable for the growth of high quality GaAs/AlGaA
s.