M. Danek et al., NEW ALLYL SELENIDE AND TRIALKYLPHOSPHINE SELENIDE PRECURSORS FOR METALORGANIC VAPOR-PHASE EPITAXY OF ZNSE, Journal of crystal growth, 145(1-4), 1994, pp. 530-536
New allyl selenide and trialkylphosphine selenide reagents; specifical
ly, t-butylallyl selenide (tBASe) and tripropylphosphine selenide, are
described for the metalorganic vapor phase epitaxy (MOVPE) of ZnSe. T
he gas-phase chemistry of allyl selenide precursors is discussed, with
emphasis on reactions leading to carbon incorporation. Secondary ion
mass spectrometry shows a negligible carbon incorporation in ZnSe film
s grown from tBASe even at high [VI]/[II] ratios, in contrast to a car
bon concentration of 10(21) cm(-3) in ZnSe films grown from diallyl se
lenide and methyl allyl selenide. The low carbon concentration is attr
ibuted to the t-butyl group precluding internal rearrangement reaction
s responsible for carbon incorporation. Low temperature growth and sho
rt residence times are critical to minimizing alkyl group redistributi
on reactions that lead to formation of potential carbon precursors; sp
ecifically, diallyl selenide. Good surface morphology on (001) GaAs an
d photoluminescene spectra with sharp near-band-edge excitonic emissio
n is reported. The need to reduce hydrogen incorporation to improve ni
trogen doping characteristics motivates the development of alternative
Se precursors circumventing formation of Se-H moieties. Phosphine sel
enides are proposed as a promising family of reagents and results are
presented for growth of ZnSe with tripropylphosphine selenide and dime
thylzinc.