W. Prost et al., METALORGANIC VAPOR-PHASE EPITAXIAL GROWN HETEROINTERFACES TO GAINP WITH GROUP-III AND GROUP-V EXCHANGE, Journal of crystal growth, 146(1-4), 1995, pp. 538-543
Metalorganic vapor phase epitaxial grown heterointerfaces to GaxIn1-xP
(x approximate to 0.5) are studied. Abruptness optimization is carrie
d out by means of a gas switching procedure using a hydrogen purge bet
ween AsH3 and PH3( )stabilization. X-ray analysis and scanning transmi
ssion electron microscopy are used to provide detailed information abo
ut interlayers and Ga-segregation from a fitting of simulated to exper
imental rocking curves in comparison to atomic-number contrast images.
InGaAs/InAlAs heterostructure field-effect transistors on an InP-subs
trate are prepared incorporating a highly strained Ga0.5In0.5P spacer
layer. Excellent transport data (mu(H300 K) > 11000 cm(2)/V.s) are pro
ving that despite the strain and segregation effect in the strained te
rnary the lower interface at the channel/spacer transition is highly a
brupt.