PHOTON SCANNING-TUNNELING-MICROSCOPY OF OPTICAL CHANNEL WAVE-GUIDES

Photon scanning tunneling microscopy (PSTM) has been used to character ize optical channel waveguides. Both He-Ne laser and semiconductor dio de laser wavelengths are utilized in the measurement of the evanescent field intensity associated with the propagating modes of optical wave guides. A tapered optical fiber tip, and also a semiconductor heterost ructure tip attached to an optical fiber are employed for detection. L ocal values of effective refractive index are calculated from measurem ents of bath TE and TM polarizations and compared to model calculation s.