Da. Christensen, ANALYSIS OF NEAR-FIELD TIP PATTERNS INCLUDING OBJECT INTERACTION USING FINITE-DIFFERENCE TIME-DOMAIN CALCULATIONS, Ultramicroscopy, 57(2-3), 1995, pp. 189-195
Numerical simulation of the field patterns in the Vicinity of a typica
l probe tip of a near field scanning optical microscope is performed u
sing the finite-difference time-domain technique. Maps of electric fie
ld vectors and Poynting vectors are given for a two-dimensional 120 x
160 cell model of the tip for p-polarized incident illumination with i
nitially no object nearby. A metal stripe object is then placed near t
he tip and perturbations of the field patterns are displayed, in parti
cular those caused by the induction of surface charge density in the m
etal object. The metal stripe is scanned across the tip plane at three
separation distances and the radiated power, determined by a sum of P
oynting vectors across a rear plane, is plotted as a function of later
al position of the object. An interesting edge enhancement effect is s
een for the close metal object, but not for a dielectric object.