COMBINED APERTURE SNOM PSTM - BEST OF BOTH WORLDS/

Authors
HECHT B HEINZELMANN H POHL DW
Citation
B. Hecht et al., COMBINED APERTURE SNOM PSTM - BEST OF BOTH WORLDS/, Ultramicroscopy, 57(2-3), 1995, pp. 228-234
Citations number
13
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
57
Issue
2-3
Year of publication
1995
Pages
228 - 234
Database
ISI
SICI code
0304-3991(1995)57:2-3<228:CASP-B>2.0.ZU;2-P
Abstract
Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanni ng tunneling optical microscopy (STOM, also known as PSTM) are integra ted into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and n ew modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new 'TNOM' technique.