Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanni
ng tunneling optical microscopy (STOM, also known as PSTM) are integra
ted into an instrument which combines the advantages of both schemes.
As a result, more near-field optical information can be obtained and n
ew modes of operation become possible. Scan images of a glass surface
with a fine grating relief demonstrate some of the capabilities of the
new 'TNOM' technique.