TIME AS A CONTRAST MECHANISM IN NEAR-FIELD IMAGING

Citation
A. Larosa et al., TIME AS A CONTRAST MECHANISM IN NEAR-FIELD IMAGING, Ultramicroscopy, 57(2-3), 1995, pp. 303-308
Citations number
18
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
57
Issue
2-3
Year of publication
1995
Pages
303 - 308
Database
ISI
SICI code
0304-3991(1995)57:2-3<303:TAACMI>2.0.ZU;2-V
Abstract
Any modulation of a detected signal can be used as a contrast mechanis m in imaging applications. Insofar as the time dependence of optical p roperties of imaged structures can be used to elucidate material prope rties, such time dependences can provide a modulation which can then b e used as a contrast mechanism in imaging. We introduce a system in wh ich time can be used as a contrast mechanism in imaging. We introduce a system in which time can be used as a contrast mechanism to study ma terial nanostructures. Single-crystal silicon wafers are imaged in the infrared using a HeNe laser while the wafer is simultaneously pulsed with visible radiation. By studying the time dependence of the infrare d transmittance, defect distribution on the nanometer scale can be ima ged, and sample nanostructure can be studied.