OPTICALLY TRAPPED NONLINEAR PARTICLES AS PROBES FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY

Authors
HERTZ HM MALMQVIST L ROSENGREN L LJUNGBERG K
Citation
Hm. Hertz et al., OPTICALLY TRAPPED NONLINEAR PARTICLES AS PROBES FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Ultramicroscopy, 57(2-3), 1995, pp. 309-312
Citations number
15
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
57
Issue
2-3
Year of publication
1995
Pages
309 - 312
Database
ISI
SICI code
0304-3991(1995)57:2-3<309:OTNPAP>2.0.ZU;2-N
Abstract
We use the frequency doubled light from an optically trapped lithium n iobate particle for non-intrusive scanning near-field optical microsco py. The detected power from this 50-100 nm diameter probe is currently tens of pW and is expected to approach nW with an improved detection system. The current experimental resolution is approximately 0.5 mu m, while the ultimate theoretical resolution is 70-90 nm. An acoustic tr ap which potentially allows higher resolution imaging is briefly descr ibed.