AN ANALYSIS OF THE KICKOUT MECHANISM IN SILICON

Citation
Mm. Desouza et Gaj. Amaratunga, AN ANALYSIS OF THE KICKOUT MECHANISM IN SILICON, Solid-state electronics, 38(4), 1995, pp. 867-872
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
38
Issue
4
Year of publication
1995
Pages
867 - 872
Database
ISI
SICI code
0038-1101(1995)38:4<867:AAOTKM>2.0.ZU;2-N
Abstract
In this paper, the characteristics of the kickout mechanism of diffusi on have been detailed. Solutions have been presented under thermodynam ic equilibrium conditions for an initial delta function impurity of tw o types: (I) all atoms are initially on substitutional sites; (2) all atoms are initially on interstitial sites. The solutions in the two ca ses are shown to be different. Further the analysis is exact to first order terms in g/r, where g is the generation rate and r the recombina tion rate. They are therefore more accurate than any presented so far and are applicable to dopants in silicon in the case of a dilute impur ity.