A SINGLE QUALITY FACTOR FOR ELECTRON BACKSCATTERING FROM THIN-FILMS

Citation
G. Messina et al., A SINGLE QUALITY FACTOR FOR ELECTRON BACKSCATTERING FROM THIN-FILMS, Microelectronic engineering, 27(1-4), 1995, pp. 183-186
Citations number
NO
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
ISSN journal
01679317
Volume
27
Issue
1-4
Year of publication
1995
Pages
183 - 186
Database
ISI
SICI code
0167-9317(1995)27:1-4<183:ASQFFE>2.0.ZU;2-B
Abstract
In this paper, Buckingham's theorem on physically similar systems is a pplied for the first time to the derivation of interpolation curves of numerical data. A simplified dependence of the curves on a limited nu mber of effective dimensionless parameters is found by a novel approac h. In particular, the method is applied to Monte Carlo modelling and t he calculation is considered of the backscattering coefficient eta fro m a general substrate in the elastic regime. A single dimensionless ba ckscattering parameter is introduced and a simple scaling law is deter mined, indicating how the configuration of the many variables involved can eventually change without affecting the result. The validity of t he law is demonstrated in the 5 to 100 keV energy range, with substrat e thicknesses ranging from 10 to 21000 angstrom and for all the substr ates of the periodic table.