NATIVE DEFECTS AND DOPANTS IN GAN STUDIED THROUGH PHOTOLUMINESCENCE AND OPTICALLY DETECTED MAGNETIC-RESONANCE

Citation
Ta. Kennedy et al., NATIVE DEFECTS AND DOPANTS IN GAN STUDIED THROUGH PHOTOLUMINESCENCE AND OPTICALLY DETECTED MAGNETIC-RESONANCE, Journal of electronic materials, 24(4), 1995, pp. 219-223
Citations number
19
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
24
Issue
4
Year of publication
1995
Pages
219 - 223
Database
ISI
SICI code
0361-5235(1995)24:4<219:NDADIG>2.0.ZU;2-I
Abstract
Native defects and dopants in GaN grown by organometallic chemical vap or deposition have been studied with photoluminescence and optically d etected magnetic resonance. For undoped samples, the combined results indicate the presence of residual shallow donors and accepters and dee p donors. A model for the capture and recombination among these defect s is developed. For Mg-doped samples, the experiments reveal shallow a nd perturbed accepters and shallow and deep donors. Hence, shallow and deep states for the native donor or donors appear in all samples. The Mg-acceptor is perturbed from its effective-mass state by nearby poin t defects.