Analytical expressions of microwave heterojunction bipolar transistors
minimum noise figure and noise parameter are reported in this paper.
These expressions are derived from a noise model including nonideal ju
nctions, emitter and base resistances and have been compared with meas
ured data obtained on a Si/SiGe HBT. An agreement between theoretical
and experimental data was observed up to 20 GHz for several bias condi
tions. The limits of the model or the range of validity of the propose
d equations have been also examined with the help of an appropriate CA
D software. The analysis of the influence of parasitic elements on noi
se parameters has shown a strong influence of the extrinsic base colle
ctor capacitance at microwave frequencies.